Test Development And Research Based On AC/DC Conversion Chip

At present,in most of the assembly and test factories,most of them are using the closed-loop test circuit,which is based on normal coil transformer to simulate the actual application circuit for AC/DC device test.The advantage is that it can similar the actual use condition as much as possible and reduce the test judgment error ratio,but the disadvantage is also obvious,the normal conventional transformer long stability time caused the test time longer and test speed slower,need about 1.6~2.0s for one unit test.In addition,minor spec differences between different transformers also result in very different test results.In order to ensure the accuracy of the test,it is also need much time to calibrate the test system with golden sample before test every time.In order to optimize the test system and improve the %GR&R,we take AP3771 AC/DC conversion chip as example and plan to use digital transformer to replace the normal transformer for test circuit design.The %GR&R is an indicator to identify the performance of a test system,the lower the better.For normal test system,the %GR&R of each test parameter is about 10%~21%,but in the digital transformer test system,the %GR&R value had been reduced to 5%~11%,the test time had also be reduced to 0.8s for one unit test.The result through analyzing the test data could be known,the average %GR&R can be improved about 38% and the test time can be decreased by about 60% with the new design test system.The reliability and speed of the test are greatly improved.This method provides a new idea and method for the other similar product test development in future.