Finned Tantalum Capacitor The Research Of The High And Low Temperature Leak Current Influencing Factors

The DCL value of moulded chip solid tantalum capacitors(chip tantalum capacitors)is the most important parameter that determines the electric properties.Especially,the decay rate of leakage current and the change rate of leakage current at high-temperature are the dominant factors of the reliability of product.In order to guarantee the operational reliability of chip tantalum capacitors,manufacturers at home eliminate the rejects showing bad high low temperature leakage current performance by setting up high low temperature screening in production.However,high low temperature screening will drastically reduce the production efficiency,due to its bad maneuverability and high production cost.In our work,the influencing factors of high low temperature leakage current are systematically investigated.In the view of materials and production techniques,we find that the sintering shrinkage,the forming voltage,the pyrolysis procedure and the dehydration condition of manganese nitrate solution are the key factors.