Testability Analysis And Test Strategy Design Of A Type Of Information Processing Equipment

With the rapid development of modern science and technology,the development cycle of electronic products is getting shorter and shorter,and the function and structure of the system are becoming more and more complex.How to detect and locate fault sources quickly and accurately becomes the key of testability research.Especially for large-scale electronic devices,testability design runs through the whole process of product design and production.Reliability and maintainability have become important technical indicators of products.As the core component of the missile guidance system,the information processing equipment has higher requirements in testability design.On the basis of the study of the testability theory,this paper uses the multisignal flow graphs model to complete the testability analysis of the information processing equipment,and optimizes the analysis results.Finally,the correctness of the testability analysis and design of the information processing system is verified by building the system test platform.Firstly,through the analysis of the information processing system,the division of functions and modules is completed.Design reasonable test points and corresponding tests based on the fault types of each module and fault signature signals and function parameters,and the structural block diagram of the system is drawn based on the analysis of the system.The block diagram builds a multisignal flow graphs model and then the fault-test correlation matrix of the system is calculated.Complete single fault feature analysis,multiple fault feature analysis and testability parameter analysis of information processing equipment based on fault-test correlation matrix.The test results are obtained and the test indexes such as fault detection rate and isolation ratio are calculated.Based on the analysis results,the fault-test correlation matrix is simplified.Secondly,based on the simplified correlation matrix,the optimal test items were optimized through an improved genetic algorithm,and the validity of the algorithm is evaluated by calculating testability index.Then the optimal test sequence of the test item is studied on the basis of the optimal test item,and the process of solving the optimal test sequence problem using DPSO-AO*algorithm is introduced in detail.Finally,an optimal test strategy decision tree for information processing system is obtained.Aiming at the testability optimization algorithm of information processing system,humanized human-computer interaction software is developed,which improves the operating efficiency of the algorithm.Finally,based on the testability analysis and design of information processing equipment,designed and developed a system test platform,including hardware circuit setup and software system development.The test of various functional modules of the system is completed,and the correctness of the selection and optimization of test points and the validity of the optimal test sequence are verified,and the test results are printed in an Excel spreadsheet.The study of the dissertation has achieved a graphical modeling analysis method for electronic devices,and the testability analysis and design of the system are completed based on multisignal flow graphs model.In addition,the optimal test strategy problem studied in this paper provides some research ideas for the test design of complex electronic devices.