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Design Of Noise Signal Generator For Noise Immunity Capability Testing Of High Voltage Floating Gate Driver

Posted on:2018-02-11Degree:MasterType:Thesis
Country:ChinaCandidate:Y X QianFull Text:PDF
GTID:2428330545961089Subject:Microelectronics and Solid State Electronics
Abstract/Summary:PDF Full Text Request
High-voltage floating gate driver chip can be widely used in civil and military industries,but because the domestic research is still in its infancy,China still depends on foreign chip imports.The noise will affect the floating ground potential of the high-voltage floating gate drive chip and will even lead to the chip's false switch.The anti-noise performance of the high-voltage floating gate driver chip is very important to the device itself and the application system.At present,there are some problems such as low level of test technology,incomplete test system,and low accuracy of noise simulation.In this thesis,the anti-noise ability testing technology of high-voltage floating gate drive chip is studied,and a noise signal generator for anti-noise capability testing of high voltage floating gate driver is designed to simulate the extreme noise environment in order to meet the requirements of noise front steepness and waveform accuracy.Firstly,the principle of Marx circuit is analyzed in detail,and the feasibility and advantages of using this structure in low voltage noise pulse generator are elaborated.Aiming at the design requirements of the circuit,the most suitable power semiconductor device is selected as the switch of the circuit.In order to solve the problem of driving the power MOSFETs,a self-supplied gate drive circuit with isolation function is designed innovatively.By analyzing the principle of charging and discharging of the circuit,two different modes are proposed,and their advantages and disadvantages are analyzed and applied in the circuit according to different situations.In order to meet the requirements of pulse waveform,the LC oscillation pulse shaping circuit is added with its parameters optimized.A parallel voltage compensation network is designed creatively for the pulse width modulation and the top voltage drop compensation problem.This structure can be used to modulate the pulse width and compensate the top voltage drop of the pulse waveform,and improve the flatness of the pulse waveform.A series stacking low-level voltage module is added innovatively,and the problem caused by introducing the module is solved by changing and optimizing the circuit structure.Based on FPGA,the control signal circuit of the noise pulse generator is designed to provide the control signal needed by the circuit.For the actual situation,a high precision low voltage noise signal generator is designed for solving the existing problems by learning from the Marx structure in high voltage pulse field.Through the test,the results reached the design targets.The noise signal generator can output high-precision square wave pulse waveform with 50-100ns pulse width,up to 100V pulse voltage,500kHz pulse frequency and 0-30V adjustable low level.The pulse front dv/dt reaches 102.8V/ns,which can be used in anti-noise ability test for high voltage floating gate driver IC.
Keywords/Search Tags:noise immunity capability test, Marx, pulse front steepness, pulse shaping, pulse modulation
PDF Full Text Request
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