D Flip-flop Radiation Hardened By Design And Pipeline Verification

With the development of the aerospace industry,mankind has paid more and more attention to the development and utilization of the space environment.In spacecraft such as artificial satellites,space stations and space probes,both the control system of the spacecraft and the storage system for internal data are implemented by integrated circuits.However,there are a large number of radiating particles in the cosmic space,and the integrated circuit chip will inevitably be hit by the radiating particles when working in a radiant environment,thereby causing serious failures.D flip-flop is the most commonly used information storage device in digital integrated circuits.In order to ensure the normal operation of the integrated circuit and the stability of the internal data,it is of great significance to reinforce the integrated circuit,especially the flip-flop circuit,against radiation.This paper takes the D flip-flop of SETTOFF structure as the research focus.First,the structure and reinforcement principle of its circuit are analyzed.To improve the shortcomings of SETTOFF structure,a new circuit is designed to replace the transition detector part in SETTOFF structure,thereby reducing the cost of the SETTOFF structure and the non-negligible correction glitches.The new flip-flop circuit structure(TDRH-FF)can detect single event effects caused by radiation such as single event transient(SET),single event upset(SEU)and timing error(TE),and correct SEU errors.Simulation comparison of the improved flip-flop circuit TDRH-FF and SETTOFF structure flip-flop,the results show that TDRH-FF has better electrical performance.Based on the smic 65 nm process,the layout and post-simulation verification of the TDRH-FF flip-flop circuit are designed and implemented.According to the library building process of standard cell,the TDRH-FF flip-flop standard cell was established.The verification results of the standard cell library show that the flip-flop standard cell designed in this paper can be recognized and used by digital circuit design tools.Finally,the D-flip-flop of the designed TDRH-FF structure is verified by pipeline.Select a representative Open RISC 1200 processor for verification,and replace the D flip-flop in the Open RISC 1200 processor pipeline with a D flip-flop of TDRH-FF structure.When SET or SEU errors occur in the processor’s pipeline,errors can be detected accurately and corrected quickly.While ensuring the normal operation of the pipeline operation,the radiation resistance of the pipeline is enhanced.