| In space applications,aerospace equipment is exposed to the complex space radiation environment for a long time,the radiation resistance of the equipment will determine the performance and service life of the entire electronic equipment.As one of the power supply systems of aerospace equipment,the switching power supply management chip bears the brunt of its radiation resistance.With the continuous reduction of process nodes to deep submicron,the impact of single event effects on analog integrated circuits is increasing,and the analog event transient(ASET)has attracted more and more attention from scholars at home and abroad.The need for ASET’s hardening technology is also becoming more and more urgent.Therefore,it is important to study the ASET hardening technique for the highly reliable DC-DC converter.Through the research and analysis of the single-event transient sensitivity characteristics of the boost converter with PWM peak current mode control,this paper studies the single event transient hardening method and verification technology based on circuit level.Firstly,the voltage loop is taken as the research object,and the single event sensitive characteristics of the error amplifier are analyzed in detail at the circuit level through the form of charge injection.Secondly,an automatic detection and dynamic compensation reinforcement method for single-event transients is proposed.The characteristic of this circuit is that it can detect single-event transient information in real time,and provide different sizes of compensation current to sensitive nodes according to the size of single-event transient information,which solves the problem of the impact of single-event transient on system performance.The single-event transient mitigation capacity reached more than 86%.Based on the consideration of the change of single event transient characteristics caused by the change of load current,this paper analyzes and verifies the transient response mechanism of the system under dynamic working conditions and radiation conditions.According to the dynamic response results of the system,a load transient detection circuit is designed to distinguish between single event transient and load transient.The circuit detects load transient information in time and outputs a control signal to control the hardening circuit,thereby realizing the improvement of system transient characteristics under dynamic conditions.In this paper,the method based on the control unit is studied to complete the hardening design for the band-gap reference module.The suppression effect of single event transient amplitude reaches 94.1%.Compared with the traditional RC filter network hardening design,it saves 33%of the area loss under the same hardening effect.Based on the 180nm BCD process,the circuit design and simulation verification of the high-reliability Boost DC-DC converter studied in this paper are carried out,and the layout design and post-simulation verification are completed.The chip works at a system frequency of 1.45MHz,the off-chip inductance is 10μH,the input capacitance is 10μF,the output capacitance is 22μF,and the load capacity is 55mA.When the input power is in the range of 2.9V～4.5V,the dynamic adjustment of the output voltage 5.8V～7.9V can be realized.It can work normally under the bombardment of high-energy particles with linear energy transfer LET=100MeV·cm~2/mg.The hardening method studied in this paper reduces the transient pulse amplitude of the system output voltage by more than 86%.It provides some theoretical guidance for high-reliability power management chips. |
