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Development Of High Speed Data Storage

Posted on:2019-12-02Degree:MasterType:Thesis
Country:ChinaCandidate:Y GuoFull Text:PDF
GTID:2382330566497610Subject:Instrumentation engineering
Abstract/Summary:PDF Full Text Request
Flight test in aircraft design and manufacturing process is a very important procedure.In the flight test,all sorts of state parameter signal need to be recorded.People evaluate the vehicle performance and technical indicators by analyzing the data.In the process of the flight test,the environment is complex,so there is a big challenge for designing the high-speed data recorder.This paper gives the design scheme by analyzing the detailed of the demand and status of high-speed data recorder.In addition,this paper gives a detail introduction for the key of hardware module,software structure and the key points for further instructions.By using a pair of resolving chain chip of TI Company,this design achieves an LVDS signal transceiver.Adding acable equalizer in the middle of the link makes a longer LVDS transmission distance.Isolating signal ground and ref-ground to prevent interference.Using two separate SMA interface implements the matching impedance.Data transmission rate is up to 300 Mbps.As the data requirements need to separate the data storage,this design uses 2 FPGA to control hardware circuit.Index module and for-end cache were exploited for high-speed data fetching.This thesis also gives a detail introduction for the realization of the key communication interface,including the realization of an LVDS receiving circuit,USB upload control logic and the realization of the communication protocol between the FPGA implementation.This design uses eight NAND Flash chips as the storage medium,which produced by Micron Company.Eight Flash chips constitute a parallel array to achieve 256 GB storage.Every two chips work together,and real-time storage rate is up to 50 MB/s,which satisfies the high data transfer rate.The design of high-speed data recorder is satisfied the technical indicators,and passed the environmental test.At present,every performance index in the process of flight test is normal,which guarantees all parameters can be recorded successfully,and provides a solid guarantee to the success of flight test.
Keywords/Search Tags:high-speed data starage, NANDFlash, USB, LVDS
PDF Full Text Request
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