The Study Of Radiation-harden Circuit Verification In On-orbit Special Processing Chip Of Optical Remote Sensing

The environment of universe is so complex that the cosmic rays which mainly combined with high energy proton?heavy ion and alpha particle and more can induce different kinds of irradiation effects to integrated circuit in aircraft electronic system,those effects can badly influence the reliability and even the life-time of integrated circuit.In the Single Event Effect,the Single Event Transient and Single Event Upset are the main reasons resulting in soft error.Nowadays,The Triple-Module Redundancy,Error Detection and Correction are the most popular methods to protect the integrated circuit from the Single Event Transient and Single Event Upset.Verification method is the most important way to ensure that the function of integrated circuit design can meet the requirements.What more,the time of verification in the flow of integrated circuit design is more than 70%.For the chip with radiation-hardened,the radiation-hardened validation has been one of the most important methods to ensure that the chip can resist the radiation effectively.In this paper,we focus on the on-orbit special processing chip of optical remote sensing,studying the verification method of radiation-hardened circuit.First,the radiation environment of the universe is introduced broadly.Then the verification methods and types are introduced,especially the radiation-hardened validation.Based on the study of theories and technologies mentioned above,the method of verifying the validation of radiation-hardened circuit is completed.During the verification,the fault injection is realized by simulating the Single Event Transient and Single Event Upset,and the checker can compare the output of the chip with the golden data calculated by the algorithm,so it can be used to judge the correctness of the function of the chip.The flow of the verification is highly automatic,and the platform can be reused continually.The design is simulated according to the verification plan.Finally,according to the result,the conclusions are that the chip can resist the fault generated during verification,and it can reduce the probability of errors produced by radiation,so the protection mechanism fit the requirements well.