The Research On Parameter Measurement Of Quantum Efficiency And Full Well Capacity For CMOS Image Sensor

With the development of semiconductor technology in recent years,the domestic and foreign research on CMOS image sensor is more and more fast,high performance of CMOS image sensor products come out one by one,is gradually replacing the CCD image sensor.Especially,the CMOS image sensor with high resolution,high sensitivity and high frame rate has a wide range of applications in the fields of scientific research,medical treatment,aerospace and military.For high-end users,the performance parameters of the CMOS image sensor in practical applications are often more valuable than the parameters of the device datasheet provided by the manufacturer.How to quantify and evaluate the performance of CMOS image sensor in the practical application and select the higher-performance CMOS imaging devices,aiming at the urgent demand,both domestic and abroad all carry on the corresponding test of CMOS image sensor in full swing.However,because the domestic research of CMOS image sensor started late,the research on the performance parameters of CMOS image sensor is slower than that of foreign research institutions.This article is according to this point to carry on my work.Firstly,investigated the development and present situation of CMOS image sensor performance parameters test,then the experimental work is carried out on the basis of the investigation.Finally obtained the following results:1.Analyzed the main performance parameters of the CMOS imaging device and extracted the measurement methods for the quantum efficiency and the full well capacity based on the EMVA1288 standard and the Photon Transfer theory.2.According to the project experience of CMOS image sensor testing system in the master study period,analyzed the hardware and software of the performance parameter test system in detail,combined with the laboratory environment,has made many improvements for a series of problems in the existing test device,The improved testing system can test parameters such as quantum efficiency and full well capacity etc..3.Applied the measurement method in the test system,and tested the CMOS image sensor for many times.The experimental data is processed by least square method and the corresponding calculation is used by MATLAB software.4.Analyzed the noise of some modules in the test system,and proposed the scheme of the noise reduction.Analyzed the the hardware circuit of the test system in terms of the speed matching between each module and the FPGA resource occupation.