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Application Study On The Regular Reliability Test Of Semiconductor Product By Ford 8D Method

Posted on:2017-11-30Degree:MasterType:Thesis
Country:ChinaCandidate:X YangFull Text:PDF
GTID:2348330515463592Subject:Industrial engineering
Abstract/Summary:PDF Full Text Request
Since 1947,integrated circuit has been developed for more than 60 years.It becomes one of daily necessities in modern life due to the application of integrated circuit is wide.With the IC industry development and increasing requirement,the basic industry—semiconductor chip becomes the focus of attention.Meanwhile,semiconductor company high-level managers and customers pay more attention to the product reliability.Product reliability is the ability to complete specified function in the specified conditions,specified time,the working life of the product in short.It is one of the criteria to measure the ability of a process.PDCA quality control circle is the basic of quality improvement.The Ford 8D method built on PDCA,which firstly used by Ford,accepted by most companies already because of strongly logicality.S Semiconductor manufactory also see Ford 8D as one of quality improvement tools.Firstly,the content of Ford 8D method,also introduced the concept of semiconductor reliability test,test theory,test items were summarized in this paper.Then,the introduction of the current situation of S Semiconductor manufactory reliability test and application of Ford 8D.S Semiconductor manufactory would conduct regular reliability test before product shipment,and analysis the test data,but no systematic response process on the analysis result.So,the research in this paper focused on the application of Ford 8D method in the response process when reliability test failed.And a detailed flow chart was established for the purpose of work efficiency improvement,manpower loss decrease,product costs reduction,quality increase…...
Keywords/Search Tags:Ford 8D, Product Reliability, Quality Improvement
PDF Full Text Request
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