Research On Measuring And Tseting Technology Of Aging Test Platform For Electronic Components

With the rapid development of semiconductor technology, the application of electronic components in industrial production, national defense, military and other fields becomes more and more widespread. These electronic components become the basic units of all kinds of electronic equipment. Quality control is always set up in our country by making secondary screening for electronic components. Therefore, further researches into the measurement and testing technology of test platform for electronic components are necessary and meaningful.In this paper, based on the research of measuring and testing technology at home and abroad, the characteristics of test bench for electronic components is analyzed and the measuring and testing system is designed. The software and hardware platform is set up and the function verification and performance evaluation for the system are carried out. The main contents are as follows:Firstly, the research on the overall system is conducted, based on the features of the test bench for electronic components, including closed space, severe working condition and difficult real-time data acquisition. In addition, the functional requirements and technical specifications of system are also considered. The design of the key unit is discussed in detail in this paper. Those works provide the necessary guarantee and guidance for the following design of hardware and software.Secondly, the design of the hardware system is achieved in this paper. The whole hardware system consists of six units: sampling unit, data acquisition unit, STM32 controller, data transmission unit, temperature control unit and power supply unit. On the basis of the general analysis of the hardware system, The election of devices, the election of circuit parameters and the circuit design for each unit are discussed in this paper.Then, the design of the system software is completed in this paper. The entire software system is based on the real-time operating system μC/OS. The kernel porting of μC/OS operating system is achieved. The driver of the module of SD card, Ir DA communication and data acquisition is designed. The application of computer and microchip is also programmed in this paper.Finally, a test platform for whole system is successfully established. The functional verification of the data acquisition unit, SD card unit, Ir DA communication unit and temperature control unit is finished. The performance evaluation is performed by evaluating the uncertainty of system. The results show that the measurement and testing technology of test platform for electronic components brought about in this paper can achieve accurate measurement of the internal signal.