Study On Electromagnetic Interference Effects Of Typical Integrated Circuit Devices

Today, with the rapid development of electronic circuits, integrated circuits have been more and more widely used in all kinds of circuit design because of its advantages, such as small size, light weight, low power consumption, good features, high-density integrated which many discrete components don’t have. As we all know, the space electromagnetic environment is increasing complex, the integrated circuit devices get more and more interfered by external electromagnetic. Thus, the integrated circuit in the practical application of the anti-electromagnetic interference has become a hot topic. For the study of electromagnetic pulse electromagnetic interference typical integrated circuit device and damage effects, paper use experimental methods to study the damage effects of typical integrated circuit device under strong electromagnetic pulse injection, using the method of simulation to study sensitive question of integrated circuits under electromagnetic radiationFirstly, several common electromagnetic pulses and their characteristics are been introduced, the damage mechanism of electromagnetic integrated circuit are been analyzed and summarized, and then choose two typical integrated circuit device which are used widely, lightning surge pulse is injected into its source-to end, forward input-ground terminal, the negative input-ground in three different test parameters:voltage pulse amplitude, pulse number of continuous injection, injection pulse breakdown has occurred at intervals when a breakdown occurs, record the test parameters and the device output terminal voltage at the waveform transient moment.Then, calculate the probability of implantation damage in certain voltage amplitude of the device, since the calculation is complicated, time-consuming, therefore, a part in the calculation of the voltage value at the probability of injury, damage to the probability of using the remaining part of BP neural network forecast. Then, all the data were analyzed to give damage threshold voltage of each end, the most sensitive end of the integrated circuit devices, use the Matlab programming to give the relation carve between device damage and three different test parameters, the relation curve between the device and damage voltage and the function.Finally, study the interference of integrated circuits under electromagnetic radiation, because most integrated circuits are placed in a shielded body cavity, and the cavity shielding for heat, ventilation and other reasons, are required in the shield cavity design apertures. In this way, put the problem into a case that study the electromagnetic radiation reference on integrated circuit which is places in a shielding body with a slit on its surface. Firstly, establish the model that electromagnetic irradiate the shielding body that contain a integrated circuit and with a slit on its surface. electromagnetic radiation cavity model built an integrated circuit, and presents a field-circuit, a new method of analysis shield cavity integrated circuit device simulation of electromagnetic interference. The method uses electromagnetic aperture coupling theory handle and shield hole coupling relationship, solving the coupled voltage on hole joints, namely the equivalent interference source.Use Pspice software, build integrated models, take the equivalent sources of interference as an input of integrated circuits, solving the voltage response of the output end of integrated circuit, that the interference voltage caused by electromagnetic radiation.