Font Size: a A A

The Design Of A High Reliability Authentication System Based On SRAM PUFs

Posted on:2017-04-01Degree:MasterType:Thesis
Country:ChinaCandidate:S ChenFull Text:PDF
GTID:2308330488473490Subject:Integrated circuit engineering
Abstract/Summary:PDF Full Text Request
As an innovative security mechanism, Physical Unclonable Functions (PUFs) have been proposed as a central blocks in some cryptography protocol and security mechanism Extract security information by the "IC fingerprints", makes the authenticatin and secret key storage is no longer depend on the Nonvolatile Electrically Erasable Programmable Read-only Memory (EEPROM) or other expensive hardware. Random-Access Memory (SRAM) PUFs as an important way to achieve PUFs, because of its low cost and ease of realization has been concerned widespread. However, experts have not study the output sequence of SRAM PUFs in-depth. As weak PUFs, some features of SRAM PUFs led its use in authentication faces a number of quentions. Based on the above analysis, this thesis includes the following aspects:First, SRAM PUFs node features analysis, explore the secutisy threats and reliability issues which may face in the application. Second, for the analysis above, design a highly reliability security authentication mechanism is based on the salted hash and Restrict Race Code (RRC). Third, build FPGA-based random number test platfoem, the SRAM PUFs cells were seprated and tested its random features by its oscillate number using the National Institute of Standards and Technology (NIST) random number test suit, to analysis feasibility applies in encryption and authentication algorithms. Fourth, this paper proposes a dynamic PUF authentication method based on RRC with two-ring strong characteristics structure.This thesis uses the NIST standard random number test to examine the safety of the output sequence, and provides a reference for the future use. This authentication aystem has hign security and reliability, with some engineering applications.
Keywords/Search Tags:PUFs, SRAM, NIST random test, RRC
PDF Full Text Request
Related items