Research And Implementation Of Semiconductor Transistor Integrated Test System’ Hardware

Discrete semiconductor devices industry is an important pillar industry measure of national comprehensive strength. And transistor is their representative device, a short period of half a century since it is widely used in social life, human civilization rapidly from the age of electricity to the age of automation. Semiconductor triode widely applied in computer technology prompted the unprecedented development of integration technology. This allows the computer technology into people’s lives. Semiconductor transistors’ characteristics make it still has a broad development prospects. With the rise of manufacturing industries, transistor semiconductor testing industry are having great demand for test equipment. Currently the majority of transistor semiconductor manufacturer also used the older of Tracer transistor or foreign general test equipment. Tracer transistor is not high degree of automation and spend lots of human resources. While foreign general test equipments’ test performance and stability are guaranteed, but the problem is obvious. So, self-developed test system is particularly important.This paper focuses on test method of a semiconductor transistor and preferred testing program to design and implementation the hardware portion of the Semiconductor Transistor Integrated Test System. This test system can realize the test of transistors’ DC magnification, leakage current, saturation parameters and reverse voltage parameters. Transistors’ measurement methods of DC magnification, leakage current, saturation voltage, pressure response has been researched, and preferably a suitable solution for this test system. A new pulse testing program be used in the measurement of magnification. Integrated test system hardware has been researched and Designed. Hardware system is divided into: CPU section, base current section, collector current section and so on. Finally debugged and verified the test system. Use of high-precision multimeter and oscilloscope verified the functionality and performance of the test system. In this paper, the semiconductor transistor integrated test system uses electronic technology, embedded technology, electronic measurement technology and other new modern technologies. It works with the feature of high precision, high speed, repeatability error small, low-cost and so on. Suitable for use in semiconductor transistor manufacturing companies’ various tests.