Test System Design For Power Chip Based On ATE And Performance Analysis

With the rapid development in recent years, electronics and informationtechnology, power technology also will be toward the high-speed and high-frequencydirection of continuous development. Therefore, PM（power management）technologyhas been widely used in many fields of information technology in the industry. Withthe continuous improvement of the frequency, which gives accurate test how theirdynamic parameters and static parameters of unprecedented challenges. As we allknow, all the commercial chips are ultimately dependent on the ATE (Automatic TestEquipment) test equipment for mass production. However, due to various types ofATE test system performance significantly lagged behind the rapid development ofPM product performance, and therefore, higher levels of integration, higher precision,lower power consumption and power management chip may face can not be based onthe existing ATE test platform production test questions, or face equipped withultra-high-performance analog modules installedATE less expensive test questions.To simplify the testing process design and save testing costs，the issue as anADI’s power management chip ADP2381for example, ATE test system design andperformance analysis solution set of easy operation. The chip can operate at4.5V~20V input voltage can be provided to6A output current.90%of the output voltagecan be input voltages from0.6V adjusted. And ADP2381switching frequency isselectable between250kHz~1.4MHz. This article first ADP2381design and testdevelopment at home and abroad in a brief introduction, followed by the relevant testof its theories were tested individually exposition given ADP2381major static anddynamic parameters, and power management several important internal chip moduleswere introduced, including a control unit, different types of voltage source,over-voltage, over-current and over-temperature protection module and referencemodules. Secondly, about the ADP2381chip testing process and testing tools.Analysis of the optimized test hardware design and testing procedures. After theintroduction of MicroFLEX automatic test system and IG-XL test software. Thispaper describes the DC test, AC test and functional test theory and test results. Finally,the test development process, test procedures and test hardware (test plate-LoadBoard) for debugging, to achieve a higher precision procedures to meet therequirements of high-precision chip itself, and gives the actual test results, and thenverify that the design of the test system basically meet the expected test performancerequirements.