The Research On The Testing Method Of Infrared Focal Plane Array Pixel Parameters

Infrared detectors have been widely used in many fields. The infrared focal plane array (IRFPA) is the core of the detector, whose testing technology has been paid more attention. The IRFPA consists of a large number of pixels and each pixel has close relationship with the system performance. The research of testing technology focuses on system parameters now, while very few study is about pixel parameters. It is urgent to develop the measurement technology of IRFPA parameters in pixel level.The main contents and results in this thesis are summarized as follows:(1) The thesis analyzes the research status of domestic and foreign testing technology for IRFPA. The relationship between pixel parameters and system performance is introduced in detail, while the significance of IRFPA pixel parameters measurement is described.(2) Measurement technology of thermal parameters and noise parameters are researched in this thesis. Electrical power test method and Wheastone-Bridge test method are used respectively to measure the thermal conductivity and thermal time constant, while the virtual instrument technology is employed to test the noise parameter, which solve the problems of complicated procedure and poor accuracy. The thesis provides the theoretical values of parameters by theoretical calculation and model simulation. Based on theoretical study, the test platforms of thermal parameters and noise parameters are built up respectively. Then various performance parameters are tested within the platforms. Finally, responsivity is derived using the testing data, estimating the performance of the detector system.(3) When the test is finished, the thesis demonstrates the feasibility of these testing methods. Based on the mature criterion of system parameters, the thesis measure the system responsivity and noise parameters of the detector. Difference between the testing data and the derived values form the pixel parameters testing is compared then, verifying the effectiveness of the measurement technology.The IRFPA pixel test method studied in this thesis can meet the testing requirements in the R&D period. It enables the modification of product design and manufacturing process in real time and has solved the problem of module level measurement. The pixel level testing can make the R&D period short. Furthermore, it provides effective reference data for the product performance optimization and improvement.