Logic Desigh Of Mixed-signal IC Ate Based On FPGA

Since "Eleventh Five-year" period, semiconductor industry has been the nationalpillar industry. However, domestic semiconductor test industry was still far behind theadvanced level of the world. A strong development of testing industry, which acted asan important role of the entire production process of intergrated circuit, was necessaryto promote the development of the domestic semiconductor industry,PC was used in the mixed-signal IC test equipment described in this thesis to dofeature settings, statistics and to show results. Test instructions and functional testvectors were downloaded by PC to test board which consisted of digital test and anologtest which werecontrolled by FPGAs severally. In order to complete the test ofmixed-signal IC, these two FPGAs should cooperate. Thus the logic design of FPGAswould be a key to this task and will be introduced in detail in the thesis.Test board consisted of controllers, storage units, excitation sources, test units andelectronic pins. In part of digit test, the pipeline design of FPGA effectively improvedthe fastest test rate of functional test, and precision measurement unit was used in DCparameters test. In part of anolog test, one low-rate16-bit ADC with8-channels and onehigh-rate14-bit ADC could meet differentrequirements. The4M storage capacity ofresults of anolog signal collection could meet test requirement of most.In chapter I and chapter II, the development history and the design principle usedof mixed-signal equipment were introducted. Chapter III introduced the whole structureof the equipment.Chapter IV describes the design of FPGAs in order to explain how theequipment works. A test case was displayed in Chapter V, and finally, some advices andoutlooks about IC test were put forward in chapter VI.