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Design And Appliacationof Hihg Reliability Circuit Structure

Posted on:2014-01-14Degree:MasterType:Thesis
Country:ChinaCandidate:S LiFull Text:PDF
GTID:2268330401452974Subject:Circuits and Systems
Abstract/Summary:PDF Full Text Request
Recently, the performance of integrated circuits are increasingly high with theimprovement of the manufacturing process.At the same time, since the feature size ofintegrated circuits are getting smaller which make them more sensitive to variousinterferences, the reliability of the circuits is greatly reduced by the resulting transientfailures.For some special application areas such as aerospace, reliability is anextremely important factor.As a kind of semi-custom circuit of ASIC, FPGA is widely used in recent years forits high density, high performance and reconfigurable characteristics.The reliabilitydesign procedures of FPGA is different from normal ASIC because of the specificcharacteristic of the inside circuit structure.This article mainly focus on reliabilitydesign method of FPGA and finish the following three aspects of work.First, design and realization of a high reliable general image processing system,the core of which is Virtex-6LX240T FPGA, image data can be downloaded oruploaded through the USB2.0interface or the Camera Link interface, the externalSRAM can meet the requirements of the image storage, the system also has somereconfigurable IO interface which constitute a fully functional image processingplatform.Second, after an in-depth study on reliability design method of FPGA, a highreliability single cycle ASIP is proposed. According to the characteristics of eachmodule of ASIP, the corresponding reliability design procedures and test validationswere given.Further more, the statistics of speed and hardware resources are given andthe detailed technical specifications are summarized.Third, according to the characteristics of SIMD array structure, this artical proposea high reliability design method which combines built-in self-test, hamming code andhardware redundancy. Each group of processing module is equipped with a redundantmodule which is fault-free by default, BIST is used to conduct fault detection andredundant module is used to replace fault module. With this method,only small amountof redundant circuit resources are consumed, but the system reliability is significantlyimproved.
Keywords/Search Tags:FPGA, Reliability Design, ASIP, SIMD array
PDF Full Text Request
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