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The Research And Design Of The Life Time Test Apparatus Of The Drive Circuit Of The Organic Light Emitting Diode

Posted on:2014-01-21Degree:MasterType:Thesis
Country:ChinaCandidate:L L WangFull Text:PDF
GTID:2248330395984132Subject:Optical engineering
Abstract/Summary:PDF Full Text Request
Organic light-emitting diode (OLED) is self-luminous, the corresponding speed, ultra-thin,large viewing angle, high luminous efficiency, low power consumption, for different substratesignificantly in recent years, so more and more people pay attention to it. Same time thus, OLEDhas been high hopes as the next generation of flat-panel display technology.OLED has many advantages compared with the mainstream display technology in the market,but there are still constraints that the OLED realize market-oriented, which the OLED life is themost important. Although OLED lifetime test instruments exist on the market, there are factors thatare difficult to meet the needs of the laboratory test, such as expensive, manipulate inconvenient,.In this article, it has designed a new type of the OLED test system, and the system sets thevoltage mode and signal acquisition as a life time can easily record.This system is a life time test system based on the89C52, having the following features: thesystem voltage and the percentage of time within a voltage period can be set by software; thevoltage of the various modes can be controlled, whereby the plurality of voltage modes may beprovided; The system can be designed by the duration of the precharge voltage, the forward voltage,reverse voltage, a constant current source, such as the numerical size, voltage, and the default modecycle. The system can measure the light-emitting duration and the voltage acrossing the loadOLED.It can keep the record, and make the experimental results more comparative. The scalabilityof the device is good. It can be more follow-up user demand, further expansion, in order to measuremore about OLED performance parameters. Test function is flexible. Users can be flexibledepending on the needs of the test. System is architecture, low cost, simple to operate.The system has a wide test defense device operating voltage up to30V. From the two aspectsof the design of the hardware and software design, discussed in detail the development process ofthe life of the test system. The life test systems currently used89C52microcontroller as the controlcenter of the entire system by the A/D, D/A, integrated operational amplifiers, sensors, hardware;system software using the the SCM software Keil compile software includes: system initialization,read data program, write data program, serial communication procedures, system clock, and so on.
Keywords/Search Tags:OLED, life test, microcontroller
PDF Full Text Request
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