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Semiconductor Laser Life Test System Is Developed

Posted on:2006-10-07Degree:MasterType:Thesis
Country:ChinaCandidate:X H XuFull Text:PDF
GTID:2208360182482502Subject:Computer application technology
Abstract/Summary:PDF Full Text Request
In this thesis, the historical development and theory foundation as well as practical significance of production reliability and life test are reviewed. Presently, the reliability and life of products has already become the important factors to evaluate the quality of products, and also the test data of reliability and life are very critical in products developing and producing. It is important to establish a set of scientific plans to provide the reliability assurance for the customers. Therefore the system for testing the reliability and life of products plays an important role in products research and development.Degradation and failure of high power semiconductor laser diodes are often happened. In order to find the failure mechanism of laser diodes, further to improve the quality of products and try to satisfy the requirements of the applications, the life test data must be obtained. The reliability and life tests provide a method for engineers to find design limitation and persist to improve the technique. It is very helpful for providing products with high performance and high reliability.As the laser diodes become widely applied, the reliability and life test system is needed urgently to acquire the real data of life testing data. However, due to the long life of laser diodes, it is not feasible to test the real life directly. For the special products, we designed and manufactured the accelerating life test system to get the life data quickly. The system has been used for the devices testing to improve the device quality. This thesis mainly includes:1) the background of production reliability and life testing;2) the reliability theory of the laser diode;3) the principle of the accelerating life test of the laser diode;4) the design and manufacture of the life test system, and the life data test of 14xx nm laser diode modules by this system;5)the conclusion: The accelerating life test system is confirmed very effective for the life test of laser diodes. It is significant for improving the quality and yield of laser diodes.
Keywords/Search Tags:Accelerating Life Test, Laser Diodes, Reliability
PDF Full Text Request
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