Shainin FACTUAL^TM Method Applied Electroluminescent Lamp Defect Improvement Reasearch

PMI004is the new generation of EL product with improved features. Itcan help customers to reduce their yield lost during EL and keypad assemblyprocesses. Company strategy is applying the new technology/construction inall EL products; hence further improve our competitive capability and marketshares.The problem during the earlier phase of scale production was high defectrate, especially to “Inner Electric Short”. It caused high reject and return rateat customer site, meanwhile higher production yield lost internally.This article firstly undertook Shainin DOE methodologies especially toPaired Comparison plus Tukey Test verification etc. To address thedifficulties of detection of Electroluminescent Lamp’s inner electric shortdefect. Established the practicable measurement and detection processes（methods）“Resistance Check” with solid effectiveness confirmation. Thathelped us to reduce customer incoming reject rate from20%to0%, andprocess return rate from1.5%to0.1%. Therefore, we’re able to stopdelivering products with potential failures to customers. Then, it undertook FACTUAL^TMSystematic Method, which is a road mapfor Shainin reactive problem solving. That guided us for EL defectphenomena study, defect strategy diagram chosen throughoutcontrast/leverage strategy adaptation. Helped us to eliminate uncorrelatedfactors, and made DOEs such as “positive-join experiment”. Understood andverified the Red-X “Poor printing quality of phosphor and dielectric layer”;applied the final B vs. C confirmation test to ensure the effectiveness andconfidence interval of the solution “3printing parameters utilization”.Ultimately, the great Shainin FACTUAL^TMSystematic Method, DOEtechniques supported project had been successfully closed against all targetedquality indicators originally set up.