FDD-LTE RF User Equipment Test System Design

LTE technology as a4G technology has been recognized by the world’s wireless communications companies. As the R&D and manufactory level continue to strengthen, there will be more and more LTE User equipment made in China, manufactured in China even designed by China. Due to the LTE technology is a new technology, we don’t have enough experience in the FDD-LTE User Equipment manufacturing and we also don’t have very perfect solution on it in China. In order to let our FDD-LTE User Equipment products have much competitive in the international marketing, we have to reduce the costs of production of the FDD-LTE User Equipment and increase the level of testing techniques. It’s much essential for the FDD-LTE User Equipment testing. The RF test is much important part of the FDD-LTE User Equipment testing which is a bottleneck in the manufactory production. It’s much important to develop a RF User Equipment test system to suitable high volume production and improve the production more efficient.By making depth study of the automatic test system and FDD-LTE technology and reference the relative international standard and specification, we find the specification which suitable the high volume production and realize these method in the production. By analyzing the situation and development direction of RF User Equipment of the comparison at home and abroad, we present a solution of RF User Equipment test system which is based upon C#language, VISA architecture and.Net technology combining the advanced theory of automatic test system, in order to fulfill all requirement from the manufacture production and make up the shortage of the field of RF User Equipment automatic test in China. In the design, we divide the test system to four modules which are Test System Setting Module, Test Application Module, Instrument Driver Management Module and Test Data Storage Module. Test System Setting Module can help operators to adjust the test system and trough the user right to manage the setting level of different operators. Test Application Module is the main part in test system and showing the test situation, test station information and test plan and test criteria number. Instrument Driver Management Module is responsible for the instrument driver invoking and set up interface between PC and test instrument. Instrument Driver Management Module also make the instrument driver independence with the test method, then the test system load different test plan and test criteria which no need to update for the software of test method and test instrument driver. Test Data Storage Module ensures all of test result storage in correct place.In the end of this paper, we use the Measure System Analysis (MAS) theory to evaluate the repeatability and reproducibility of FDD-LTE Test System.