The Design Of Memory Testing System Based On LabVIEW

As one kind of the basic storage substance that Semiconductor Memory has been widely used in Computer, Mobile electronic Device, aeronautic industry and other fields.Because of the huge bad influence of the Space SEE offect when aircraft fly in the Space, it is much more important to insure the spaceflight used Memory function credibility and performance Strong.The Semiconductor Memory needs to be fully tested in the land simulative Space environment before it is used, so to design a System for Testing high performance Memory used in the land simulative Space environment is requisite and needed.Based on the background of the need for testing high performance Memory under land simulative Space environment, this paper present the VLSI testing method, propose the System design scheme and accomplish the modules of the System.The major research and design work in this paper is shown as follows:For the first this paper present the conception of virtual Instrument technology and the development direction of automatic testing system. Then this paper introduced the memory function model, many kinds of memory faults and also the memory testing algorithm. For the third, combine the testing requirements in the land simulative Space environment, this paper design the framework of the system and plan the modules of the system particularly. And then mainly introduce the testing module in the system implemented by Verilog HDL. Last detailed analyse how to process the control unit in the computer part based on the LabVIEW graphics programming environment and improve the automatic control of the system.The Testing System this paper illustrate has been validated in the laboratory and also the land simulative Space environment.The method that combine the VLSI testing technology and virtual Instrument technology illustrated in this paper has made the system extensible and testing convemency.