Based On The Fpga Ic Time Parameter Measurement Unit Design And Validation

The domestic IC industrial scale, which has doubled during the Twelfth Five-Year Plan, showed its growth as735billion RMB by the end of2010, accounting for43%of the globe value. The increasing IC integration scale places higher requirements on IC testing technology and meanwhile raises the cost of IC testing. IC automatic test equipment (ATE) is the key point of IC testing technology and cost. The IC Time Measurement Unit is one of the function parts of an Analog IC ATE, which is designed for testing of AC parameters.The background and significance of the project is given in chapter one. In chapter two, a brief introduction about IC testing, including testing process and testing classification, especially about AC parameter testing is given firstly and then several common methods of TDC (Time-to-Digital Convert) are presented in detail.The systematic structure of the IC tester is firstly introduced in chapter three, and then a detailed statement about the design and implementation of TMU is made, which includes the design of channels and input circuit, built of comparator circuit, generate and setting of threshold, and the translating of logic level. The RMS (Root Mean Square) module which is integrated on the same board is also introduced in this chapter.The chapter four of this paper explain how to choose and built the FPGA platform for the time-measurement in its first part, and then give the detailed methods of time-interval and period/pulse width measurement implemented in Xilinx Virtex-4SX. At the end of this chapter, one method is introduced to avoid the jitter in the low-frequency condition. The test and verification result are presented in chapter five, which indicates that the TMU/RMS board can achieve a2ns resolution in time-interval measurement and complete the AC parameter testing.