| Infrared imaging system play an important role in modern optoelectronic system. The development of advanced infrared imaging system always companied with some corresponding testing method and device. This paper discussed some specific problems in infrared imaging system MRTD testing and approval technology. Based on analyzing the characteristic of current infrared imaging system, the measuring method of instrument constant was given which used high precision infrared imaging temperature-measuring instrument, the correction calculating model was formed. According the problem of product's focusing state before testing, a method was established which focus precisely through image-processing, the relative measuring software was written. The technology questions were discussed which occur in MRTD measuring comply with current military criterion, a MRTD measuring method for limit distance imaging state was presented. The MRTD quantitative analyzing technology was presented which based on studying the specialty of edge imaging, and according the question of finding the CCD linear section, a fast measuring method based on image-processing was present. the TOD measuring system was build, some basic TOD measuring technology research have been done. |
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