Ns Laser Output Energy Fluctuation Detecting Device

Z-scan technology is a method which can be used to measure nonlinear optical properties of material. The stability of laser output power is a necessary prerequisite for Z-scan technology measurement. Laser pulse peak power is an important parameter of laser output pulse, reflecting the change of output laser intensity. Monitoring the laser pulse peak power in the Z-scan experiment can help people select qualified data, improve the accuracy of the measurement.In this paper, the method of the laser power measurement was summarized. And a detector device was designed by using C8051F120 microcontroller chip as central processor which based on the effect that the output current of PIN photodiode increases linearly with the laser power. The device can be applied to measure the relative value of laser pulse peak power, therefore it can monitor the fluctuation of output energy when Z-scan experiment is carried out.