8 Mm-band Detector Parametric Test System Developed

The parameters test system of Ka band detectors has been implemented in this paper, and it is employed to test the parameters of detectors in the process of development and production, with the purpose of quality assurance. The field test simulation can be carried out by this test system indoors, and it is convenient to improve test efficiency and reduce both test cost and development cycle. So the test system plays an important role in the aspect of improving the performance of millimeter-wave detectors.Based on the practical project for short-range detection, this paper has analyzed and verified the similarity between the actual gun-launched system and hardware-in-the-loop simulation test system. Then the parameter test system designed for both the continuous-wave Doppler (CWD) detectors and frequency modulated (FM) ranging detectors is discussed. The research can be summarized as follows:1) Depending on the analysis to the principle of hardware-in-the-loop simulation test system and the corresponding realistic gun-launched system, the similarity between the test system and the actual system is proved.2) According to the requirements put forward by detectors being tested, the index requirements of the anechoic cabinet are outlined in this paper, then the suitable absorbing material is selected and the structure and size of the cabinet is also designed.3) The parameters of each component in the target simulator is analyzed and calculated, in addition the type of each component is selected.4) The module of data acquisition card has been selected, and then both the hardware design of the interface circuit and software design of the test system has been completed.5) The hardware-in-the-loop simulation test system has reached the equivalence with realistic gun-launched system after the calibration by means of standard detectors.