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The Operation Of The Ic Testing And Analysis

Posted on:2002-06-19Degree:MasterType:Thesis
Country:ChinaCandidate:J WuFull Text:PDF
GTID:2208360032956688Subject:MBA
Abstract/Summary:PDF Full Text Request
The IC test is one of important fields in the procedures of IC manufacture. The IC test operation is also a hinge and core of IC test. The early 1997,Alphatec Electronics Corporation of Shanghai(ATES) started IC test operation, which marked a ne~v strength was incorporating with the field of IC test following the development of IC industry in China market. In the past of several years, ATES test was advancing step by step toward the target of development. Nowadays, it can test a lot of IC devices with different shapes of package about sizes and leads as well as different electronic functions such as digital, analog, mixed digital and analog signal. All of devices tested has been used widely in many field of domestic and abroad industry, science & technology, automobile, aviation, military service and electronic consumable, etc. for the development of information industry and the increase of national economy. The theory comes from the practice and comes back to guide the practice. The thesis studies the test operation and research of IC and operation example, gives us better understanding of process and characteristic in the IC test operation as well as good reference for our manufactures in changing business concept, improving organization structure and reducing operation cost, cutting operation cycle time, continuously upgrading quality of device and opening up source market of device for the IC test. Chapter 1 introduces the overall background and business of ATES, enumerates many competitive advantages facing to the IC market. Chapter 2 introduces IC test, displays the whole process of test operation and workshop layout in ATES. Analysing the capability of IC test in ATES, Points out requiring to solve the problems based on Bill Transmitter Order(BTO), and then discusses the operation tactics of IC test. Chapter 3 imports the concept of Business Process Reengineering(BPR),according to the case of IC test operation about the device of PLCC package in AlES, introduces the process of Business Process Reengineering(BPR) in test operation of AlES and discusses it constructively. Chapter 4 discusses significantly the strategy of IC test to the soul of IC test, introduces the process and the way of the test equipment selection, gives a mean of decision-making for the selection of test equipment in terms of the typical model of purchase vs. lease 3 of 63 ~f1~Th Chapter 5 imports the thought of Systems Thinking which makes to cope with the competence of market for decision-making and makes a suitable response for adapting the globe tide in the field of IC test. Chapter 6 reviews the challenge and opportunity for ATES under the change of silicon cycle time in globe market. Finally, it summarizes the lessons in IC test operation for ATES and raise up some suggestions for improving the test operation of AlES.
Keywords/Search Tags:IC Test, Business Process Reengineering(BPR), Contractor Equipment Manufacturer(CEM), Bill Transmitter Order(BTO). Lease, Model, Cost, Cycle Time
PDF Full Text Request
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