| This thesis discusses the integrated experiment system of photoelectricity characteristic measurement , this system computerize by MCU,serial port communication and corresponding software,with the advantage of high integrated,being small, and easy to be operated, it can measure all kinds of parameters of LED, LD, and many other photoelectric detectors immediately.The light source and detector can be changed according to each experiment, Output signals of the detector are amplified by a current amplifier and then be collected by an A/D collector under the control of MCU, after being transferred to digital signals, the data communicate with the computer through the RS-232 serial port, and finally come out in the form of curves after the computer processing.Global analysis of the experiment system, including each part's design concept and realization, is presented in this paper on the base of principles of the measurement of spectrum instrument and photoelectric detector , and the method of measuring each parameter is emphasized, it is ended by a group of results and together with their accuracy analysis. |
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