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System Design And Research Of Color CCD Measurement

Posted on:2011-11-07Degree:MasterType:Thesis
Country:ChinaCandidate:G YinFull Text:PDF
GTID:2178360308458065Subject:Optical Engineering
Abstract/Summary:PDF Full Text Request
Linear array CCD measuring system is based on non-contact measurement system, it can complete some of the traditional measurement tools can not achieve the measurements (such as: measuring the length of high-temperature solid, etc.). And in the measurement processing,it also has a high detection accuracy, processing speed, anti-interference ability, stability and so on, has become the hot research field measurement, and Widely used in image acquisition, non-contact measurement and real-time monitoring and other fields. The current line array CCD systems, the use of more is a single array, while it has more advantages, but because it is single pixel array, and therefore can not be applied, such as high temperature measurements of objects and object offset angle measurements. This research and design based on three-color multi-function color CCD measuring system is not only good to make up for this flaw, but also to complete the monochrome CCD measuring system functions.This paper described the measurement principle of CCD measurement system based on the design of a color CCD measuring system of the whole structure, including the optical system and collection system. As the optical system design can be measured with different targets and flexible movements, the paper focuses on temperature measurement system for the optical system design; acquisition system, the use of FPGA + ARM platform architecture, using specialized for processing color CCD signal chip VSP3100, it integrates CDS, PGA, ADC three functional modules, reducing the noise from the device interfaces, but also because of its small size, convenient for the hardware design and layout. Also selected in the acquisition system comes with USB controller chip ARM LPC2148, not only complete high-speed data transfer and larger capacity for its built-in FLASH, without external expansion memory, makes hardware design easier. In software designing, the main driver to complete the FPGA design and ARM timing master programming. In the FPGA programming are used in the embedded FIFO core, rational use of FPGA resources to reduce costs.Finally by measuring the diffraction intensity distribution of test system accuracy and stability, and give specific data and error analysis. The results show that the measurement system has high precision and good stability, easy operation, with the actual value.
Keywords/Search Tags:CCD, Measurement systems, thermal radiation, single-slit diffraction
PDF Full Text Request
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