Research And Application Of The Microwave High Power Automatic Test System Based On The Load/Source Pull

With the progress of science and technology and the rapid development of information industry, microwave transistor amplifiers play an increasingly important role in microwave circuit design and applications. The research on decreasing its noise figure and increasing its operating frequency and output power , and some device parameters like these , has become an important subject in fully raising the independent research and development level of microwave and millimeter-wave devices.This subject studies in a high-power microwave automatic test system which is based on the Load / Source Pull technology. This automatic test system is able to add the known load / source impedance to the device under test by controlling the automatic tuner. Then it studies a variety of changes and best value of device parameters in different conditions using a certain testing and data processing methods. This study provides an important basis for the design of microwave circuits .There are many insufficiencies of tuners in traditional test, such as its impedance can't be quantified controlled precisely, it is a heavy work load to tune in input and output ends, it is hard to accurately measure the device's input and output impedance, it is also hard to accurately give the variation regularity that output power, gain and efficiency change with the load impedance ,and so on. This paper firstly describes foundation theory of the development of high-power automated test system .Then combining hardware features of tuner AV3011A and according to the insufficiencies of tuners in traditional test , this paper determine the scheme of structure of the test system. Automatic tuner calibration software and power measurement software of systems are writed in the LabWindows / CVI environment, and a stand-alone executable file from the Lab Windows / CVI development environment is also generated . Finally, this paper describes the practical application of this high-power microwave automatic test system .The major job is completing the automated testing of maximum power point of the power device SPF-2086TK GaAs FET, then analyzing the calibration and test data .This system has achieved the intended purpose of subject, and the feasibility and correctness of system software has also been verified. The future main task is to study the measurement errors caused by interpolation in calibration and the correction method.