The Storage Test System Designing Based On Programmable Device

In the conditions of no effect or the effect can be permitted, the storage test is a dynamic testing technology defined as implant micro-data acquisition and storage tester in the Objects which is wanted to be measured, so the information can be field and real-time collected and memorized, and then recycle the recording devices, the tested information can be processed and reproduced by the computer. The birth of programmable devices brought enormous significance to the storage test system. This article is to examine the storage of the internal circuit test system. The function of freely configuration of analog and digital arrays and online programmable have been achieved.In this article, parts of digital circuits and parts of analog circuits were firstly analysised. The memory part is separately designed and researched with programmable analog devices ispPAC20 and ASIC. Lastly, comparison the PSoC program and other programs, the controller uses CyPress PSoC system-on-chip microprocessor as a control core.In addition to the digital proeessing functions the normal MCU possessed,the PSoC chip also Integrates a number of analog blocks,related analogBus,comparator bus and analog buffers.The user can achieve the required specific functions and save the system resources via allocating the on-chip digital and analog blocks resources.Because of the realization of In-System Serial Programming and the usage of dynamic re-allocation function, the PSoC has powerful flexibility and integration capabilities,eliminates the burden of chip microcomputer system expansion,also improves the system reliability and stability. This paper gives a specific description on the storage test system and software design of circuit. The modularization design in software advances its efficiency.