| With the development of optoelectronic technology, semiconductor laser diodes (LDs ),as a kind of important light source devices, are widely applied in industry , medicine treatment , military science and information technology in the field of high-tech ,and their applied domains are also expanded .As a new type of semiconductor laser diodes (LDs ),compared with the traditional LDs of radiation on the side face , VCSEL has many advantages : Because of eradiating the beams of laser light on the underlay vertically , it is fit to be applied to the light source of the planar array. Because of the high-quality beams of laser light, for example, the emanative angle of the beams of laser light is tiny, it has a symmetrical circular facular, it is easy in the FDDI coupling. Because the length of the syntony cavity is much more short, the interval of vertical module increases. It realizes to work in the dynamic- simple module mode. Because the section-size of apparatus is small, it can be produced for the high-density face-array and increase the eradication power of light. Its techniques produce and detection of the whole chip is not need to decompose the chip. It is easily integrated with other optical apparatus. So it can be applied in the field of optical communication, optical interlink-age, optical info-disposal etc. For the wide application foreground, scientific research department and research personnel put up a long-term and extensive research on different configuration and different parameter VCSEL with the different configuration and different parameter. The research area relates to the many areas, for example the material element, the configuration of apparatus, the capability of apparatus etc of the every wave band from ultraviolet to infrared. And they have taken out a great progress. People always expect the LDs applied in some fields to work in a long-term reliably. So the reliability of the apparatus is the one of the hotspots of the research. At present, it usually adopts the method of accelerating electricity aging to evaluate the reliability of the apparatus, and based on activation energy get in the life experiment, it can calculate the work life. This data is the statistical result, it is devastating to the apparatus and it costs a long time.Lately people have discovered that all kinds of the faultiness of the materials and apparatus are the important factors of influencing the reliability of the apparatus, for example, it has the chemistry impurity not needed, the bug of crystal lattice, the depth energy grade center and the surface interface state etc. These faultinesses are potential in many instances, and its action relates to the time and stress. In the work initial stages and on the natural stress, this potential faultiness hardly influences the reliability of the apparatus. It can be detected and filtered difficultly by the routine methods. But the noise is very sensitive to it. In the state of existing the faultinesses and the bugs of the apparatus, it can bring a low-frequency electrical noise. So a low-frequency electrical noise can be used to a kind of facility to detect the quality and reliability of the LDs. By the way of detecting this kind of faint random signal, we can not only confirm the faultiness, but also analyse the source of it. This method does not need outfield energy to excitated, it can reflect the latent quality of the material and apparatus. So we can evaluate a reliability of the apparatus. It also has many advantages of quick and simple detect and being scatheless to the apparatus. Therefore developing the research on the low-frequency electrical noise of the apparatus has a important purport to improve the capability of the apparatus and produce a low-noise apparatus. Based on the idea, in the work I have a research on the low-frequency electrical noise and reliability correlation of high power VCSEL. This thesis is supported by the item of the ChangChun city science and technology department"980nm high power VCSEL array and evaluation of the reliability".The central work in this thesis is that: on the basis of confirming the low-frequency electrical noise can reflect the faultiness of the material and apparatus, and it has a consanguineous relativity with the quality and reliability of the apparatus, in use of the direct measure system of adopting preamplifier and frequency chart analyzer I have detected the power chart consistency of the low-frequency electrical noise of the high power VCSEL in the range of the low excursion electric current. In order to guarantee the veracity of the detecting result, I have adopted some technology included multilayer screen and anti-jamming. The basis of the theory in the experiment is that, based on the formula of power chart consistency of the low-frequency electrical noise we can know that conclusion (not involved of the g-r noise). There are three token parameters: the range of the white noise—A, the range of the 1/f noise—Bv, the exponential gene of the frequency—Υ.The power chart consistency of the low-frequency electrical noise of being practically detected is the concurrent result of the different noise ponderance and all token parameters of the ponderance. Every ponderance has the different physical meaning, it matches the different structural characters and bugs. So we must separate all kinds of the noise ponderance from the power chart consistency of the low-frequency electrical noise of being practically detected, and accurately calculate the all token parameters of the ponderance. Thus we can analyze the noise physical phenomena of the apparatus.In the experiment we have pick-up and separated three token parameters: the white noise, the 1/f noise—Bv, the exponential gene of the frequency, and we have compared them with the low excursion electric current by the noise soft. The result of the experiment has show that in the low excursion electric current the low-frequency electrical noise mostly present the Bv noise character. In the range of different excursion electric current, the change of the range of the voltage 1/f noise of the high quality apparatus with the excursion electric current is regularity. These are two facts: one is that with the accretion of the excursion electric current, the range of the voltage 1/f noise first accretes, then does not change, at last decreases gradually. Two is that with the accretion of the excursion electric current, the range of the voltage 1/f noise first accretes, then decreases gradually. We have analyzed the two phenomena in use of the isotonic electrocircuit of the LDs, and we make a conclusion that the movement of accretion of the voltage 1/f noise is brought by the shunt-wound leaked resistance, the balanced movement of the transition is the concurrent result of the energy section and the shunt-wound leaked resistance, the movement of decrease of the voltage 1/f noise is brought by the bugs of the energy section. We compared the apparatus each other and discovered that the leaked grade by the shunt-wound resistance of the different apparatus was different. |
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