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Research On The Reliability Test Evaluation Technology Of RFID Smart Card

Posted on:2009-09-12Degree:MasterType:Thesis
Country:ChinaCandidate:C ZhangFull Text:PDF
GTID:2178360242490696Subject:Electrical engineering
Abstract/Summary:
Radio Frequency Identification (RFID) is a contactless automatic identification technology, which takes advantage of radio signal and space coupling (inductance or electromagnetism coupling) transmission characteristic to identify objects. The RFID smart card has the characteristics of small volume, large capacity, long life, repeated using and so on. It supports rapid reading/writing, invisible identification, moving identifying, many objects identifying, orientation, tracking and management in a long period. It has a wide application outlook.This thesis combines the 863 key project-Test Technology of RFID System and Construction of its Open Platform , making deep research on the reliability prediction ,reliability tests and function in application of RFID smart card.This thesis represents the method to predict the life of RFID smart card, and establishes the reliability prediction model of RFID smart card function block both in operation status and non-operation status. In this way, it provides quantity analysis result to the RFID smart card research progress which avoids technique measures must be taken for reliability or repair, or highly reduces the cost and time for taking blind actions.This thesis represents the reliability tests and Physical Damage Analysis (DPA) tests. The reliability tests can evaluate the reliability of smart card fully and scientifically. The DPA tests can reveal the defects of smart card design, so we can do available changes according to the defects to improve the reliability of smart card.This thesis analyzes the reliability of smart card in details when we use it. We make deep research on the operation frequency , operation range, angle, moving speed, anti-collision and effect of metal material, overlapping of smart card, especially the anti-collision arithmetic of smart card in frequency 860~960MHz. The thesis represents the test plan to evaluate the reading reliability of smart card in application. The customers can choose suitable RFID smart card to assure high reading reliability according to the environment and requirements of RFID system.
Keywords/Search Tags:Radio Frequency Identification, Smart card, Reliability
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