Development And Application Of The Software Of The Radiation Immunity Test Benches

With the rapid development of the technology, the electronic, electricalequipment and system are widely used. However, electrical equipment, thecommunications system, control systems and computer systems have a tremendousnegative impact by the electromagnetic energy conversion generated in the operationof the electronics. Thus, it's very important to do the EMC (electromagneticcompatibility) test for the electrical equipment. Today the EMC of products havebeen required as the state compulsory product certification in many countries.Without certification, the products shouldn't be manufactured, imported andmarketed. In order to measure EMC, many kinds of EMC test methods have beendeveloped to adapt the various demands.Due to the complexity of electromagnetic wave propagation, the calculation ofelectromagnetic field intensity distribution in EMC test bench is a bottleneck for user.And because there are many equipments and programs in the EMC test, in thetraditional test user often spends a lot of time and efforts on the operation ofequipment, data handling, and data processing. As a result, the efficiency greatlyreduces and the possibility of mistakes increases.With the development of computer calculation, we can carry out precisionanalysis to electromagnetic field using the three-dimensional electromagnetic fieldsimulation software such as HFSS and CTS. And because the development ofdistributed control and virtual instruments, we can construct a computer-controlledintelligent systems to increase the effective of test.In this thesis, radiation immunity test benches are studied and analyzed in detail,and program the software for these test benches. Through analysis the theory ofmethods of TEM (Transverse Electro-Magnetic) cell and near field and combiningwith the results of the simulation, verify the coherence of the simulation and measure.The system design, operational principle, the parameters of hardware and thesoftware are introduced in detail. At last, system debugging is illuminated and experimental results are presented with an invert.The experiments show TEM (Transverse Electro-Magnetic) cell test canprovide user the global information about the behavior of the DUT in test, and nearfield test can provide user the local information. These two test benches have a goodcomplementarity for each other.