A Study And Design Of Photoelectronic Parameters Measurement System Of Quadrantal Infrared Detector

Quadrantal infrared detector is a key part of many kinds of infrared systems, whoseparameters decide the character and quality of the system. So it is important to measure theparameters of the detector. By the study of the main ways and means to measure quadrantalinfrared detector, we give out a suit of methods to design a measurement system of thequadrantal infrared detector, which make it possible for the detector users to get theparameters of the detector easily with less time. The measurement system mainly achieves the parameters below: Responsibility, Undercurrent, Capacitance, Homogeneity, Co-Disturbance. The system is composed with the laseraid, optical system, circuit system, computer and several special measure instruments. TheGPIB bus is used to connect the special instruments with the industrial computer. The systemis equipped with the industrial computer,digital oscillograph,CV gauge,spectrum analyzer,picoammeter/voltage source. The more instruments may be equipped according to the testtasks. The industrial computer is used to give out instructs and deal with the data from everyinstruments of the system. In the paper, firstly, the principle theory of the several parameters is discussed. Secondly,the measurement means is discussed and the appropriate ways are offered. After that, thedesign and the realization of the DPSSL and the optical system are discussed. In the chapterfour, the design of the circuit system, such as the GPIB bus,the switcher. At last, the outcomeof the test is discussed. The software is the important composer of the system . In the paper , the software isdeveloped with Microsoft Visual C++ in the operate system of windows2000 . The run of the system indicate its accuracy, reliability and the facility.