Research On High-Speed Apparatus Parameter Signal Acquisition

At present, low-voltage apparatus are developing toward greater capacity, smaller size and higher performance. It needs much better performance and higher reliability for low-voltage apparatus. So high precision detecting equipments are needed to detect some important performance parameters of low-voltage apparatus. After carrying out great deal of related researches on this subject home and abroad, we developed "High-speed Acquisition and Processing System of Switching Apparatus Experimental Parameters" , which can acquire and process many important parameters such as circuit power factor, power frequency, joule integral(I t), arching time and the voltage between two contacts, etc..To realize high-speed data acquisition of apparatus experiment, PCI bus kernel was designed in FPGA, which could realize high-speed communication. A proper storing system was also designed to solve asynchronous speed problem between A/D section and PCI bus. Appropriate A/D chip was chosen to realize high-speed data acquisition. The High-speed Data Acquisition Card of Apparatus Experiment can meet design requirements: 9 independent detecting inputs are realized, each channel collecting frequency can achieve 1MHz, the collected data are exact, and the system can run stably. Because of multi-interfere source of testing field, In order to increase the veracity of system, acquired signal is processed in real time when FIR figure filter is designed in FPGA. Three trigger manners are designed by acquisition system: initiative trigger manner, passive trigger manner, automatic trigger manner. At last we also developed the driver program on Windows 2000 operation system based on WDM and the software system of analyzing and management of apparatus experimental parameters.This dissertation also introduced some hardware and low-voltage apparatus software design experiences, which covered many techniques such as high-speed data acquisition, hardware circuit design of high-speed PCI data acquisition broad, FPGA design, WDM and the algorithms of apparatus experimental parameters, etc..