Research On Test Technology For Data Acquisition And Feature Extraction System Of Broad Band Measure Radar

In modern complicated electronic system, test technologies and designs for test have been emphasized universally and applied widely as an important way of improving the systemic mensurability and maintainability and deducing the service time and the maintenance expenses of system. In this paper, with the background of the systemic test of a data-acquiring and feature-extracting subsystem of X-band feature-measuring radar, the demand of system real time state testing and fault diagnosing of radar is studied. And the performance of the key components in this system has been tested. Based on this researching result, the design and debug of BIT(Built in Test) hardware and software is completed. And the result of research referred in this paper has been applied into the data-acquiring and feature-extracting subsystem of a new type radar. The main contents in this thesis are as follows:1. Discuss the significance and the testing way of ADCs dynamic parameters. Analyze the importance of ADCs dynamic parameters to digital orthogonal demodulation receiver. Then test its ADCs performance systemically and analyze the testing result. Analyze the impact of short unstableness of the signal generator on the test result.2. Study the mechanism of generating waveform data of radar target simulator. Mainly analyze the intrinsic spur problem of generating waveform technology based on DDS. Discuss the source of the scattering and some corresponding suppressing ways. Test and evaluate the performance of the simulator, which is based on the DDS technology.3. Analyze the architecture of the data-acquiring and feature-extracting subsystem of wideband measuring radar and its testing demand. Then a two-level testing project is put forward. Bring forward the design flow of BIT based on the bus architecture. Finally complete the BIT subsystem of the data-acquiring and feature-extracting system based on the DSP+FPGA framework.