Host Computer Software System Design Suitable For Large-scale 3D NAND Flash Testing

With the increasing market demand for large-capacity database storage devices,3D NAND Flash(hereinafter referred to as flash memory)has become one of the most ideal large-capacity storage media for its low power consumption,low cost,anti-vibration and non-volatility.Although the continuous improvement of the flash memory manufacturing process meets the increasing demand for capacity,the reliability of flash memory has become more and more serious.The feature size of flash memory continues to decrease,and the new flash error mechanism brought by the 3D structure makes flash memory more prone to errors.The reliability of flash memory has become one of the important factors restricting the continuous development of flash memory,and the related detection of flash memory reliability has become particularly important.For flash memory reliability testing,the existing flash memory test equipment at home and abroad all have low test efficiency,lack of reliable data processing and analysis,and destructive testing.They can only be used for university experimental research and cannot afford large-scale flash memory testing.task.Therefore,this article uses the C# programming language,based on Socket programming and thread pool technology,to design a host computer software system suitable for large-scale flash memory testing in detail.The host computer can simultaneously control 64 flash memory test boards(developed based on xilinx zynq7030)to perform various types of flash memory tests in parallel and independently,and collect the original test data through the Ethernet port and store it in the SQL Server database,process and analyze the data,and then According to the obtained bad block rate and bit error rate of the flash memory chip,the flash memory chip is screened and rated according to the specified standard.In addition,using the joint programming of C# and Matlab,the artificial neural network is used to establish the prediction model of the remaining life of the flash memory,and the non-destructive test of the life of the flash memory is realized.Finally,the host computer supports the efficient export of the original test data into a flat csv file,and generates a report document based on the test data,records the specific information of the test task in detail,filters and life prediction results,and gives a P/E(for the flash memory block).Program/Erase,program/erase)the change curve graph of each physical parameter in the cycle.In this paper,512 Intel flash memory chips are selected as the test experiment samples,and the flash memory test host computer software has been tested and verified by the system,as well as non-functional tests for fault tolerance,performance,system resource occupation,etc.The test results show that the host computer can Efficiently complete large-scale flash memory test tasks,and has good ease of use and reliability.