High level test approaches for mixed-signal systems

Traditional test for mixed-signal circuits concentrates on basic blocks as test targets where each block in the system is tested in an isolated manner. With increasing levels of integration, application of these traditional methods requires external access to each of the basic blocks in the system. In order to address these issues and provide cost-effective solutions for testing mixed-signal and RF circuits, methodologies that utilize system-level knowledge and capabilities are needed.; The use of functional signal paths for test access provides avenues for low-cost test approaches by reducing the number of necessary test points and reducing test time through test parallelization. An infrastructure aimed at test signal propagation is constructed as a framework to be used in various methodologies attacking distinct test problems.; High level module models that are developed capture the desired behavior in detail while keeping track of limited, worst-case information about non-linear response and noise in order to compute their effects on test accuracy. Experimental results on various industrially relevant mixed-signal systems demonstrate up to 75% reduction in hardware overhead, 40% reduction in test time, while keeping the test coverage above 97%.; The feasibility of high-level test approaches is also demonstrated in the more intricate RF domain through a case study of Bluetooth designs. Testability analysis at multiple levels of design hierarchy is used to identify problems that endanger system-level test development and architectural solutions to these problems. This case study confirms that overall low-cost solutions in the RF domain can be achieved only through incorporation of testability concerns into design decisions.; The final focus of the thesis consists of the design of concurrent test hardware for the most susceptible components of mixed-signal systems used in safety critical applications. (Abstract shortened by UMI.)...