Inductive coupling for reflectometry devices |
Posted on:2004-06-18 | Degree:M.S | Type:Thesis |
University:Utah State University | Candidate:Grandhi, Nagendra Prasad | Full Text:PDF |
GTID:2468390011475958 | Subject:Engineering |
Abstract/Summary: | |
Aging of aircraft wiring is a critical issue, which when overlooked can prove to be disastrous to the aircraft. Reflectormetry devices (Time Domain Reflectometry (TDR)/Frequency Domain Reflectometry (FDR)) are generally used to determine the faults in the cables. Connecting the cables under test to reflectometry devices (TDR/FDR) by inductive coupling removes the need for breaking or opening the cable under test and also reduces the wear and tear of already aged wiring. This research was aimed at introducing and establishing inductive coupling in conjunction with reflectometry devices (TDR/FDR). Parametric analysis of inductive coupling was studied. |
Keywords/Search Tags: | Inductive coupling, Reflectometry, Devices |
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