| Most of today's modern electronics devices are implemented using mixed-signal methods. In many of these applications only the device interface falls in the analog domain while all internal processing is digitally performed. This dominant role of the internal digital processing makes accurate analog to digital and digital to analog conversion a critical aspect for the correct system performance. Oversampled converters exploit the enhanced speed and circuit density of VLSI technology to overcome the limitations induced by poor component matching and reduced power supply levels. This thesis presents an accurate behavioral macro-model of &Sgr;Delta Modulators. A behavioral modeling technique based on the system symbolic admittance node matrix was deviced. The newly proposed technique provides a more reliable modeling of the degrading effects of capacitor mismatch, jitter and thermal noise, as well as integrator finite switch resistance and settling errors on high-speed sigma-delta modulators. Result from extensive simulations have show the model to be accurate compared to real and SPICE simulated data, with small execution times. |
