| A powerful new class of microscope, the Atomic Force Microscope, has led to a deeper understanding of the nanoscale world. The Scanning Probe Microscopy group at McGill University has developed an AFM whose general design lends itself readily to imaging, spectroscopy, and manipulation on an atomic scale.;There are many challenges to building such a system. A major concern is the isolation of the microscope from external vibration sources, such as building vibration, people walking and talking next to the microscope, etc. These vibrations are orders of magnitude larger than the precision needed to detect the small variations of an atomic surface. A number of measures were developed to provide the isolation needed, including a series damping plates that support the microscope.;An electromagnet was developed as an addition to the microscope as an aid to investigate the magnetic properties of samples. The magnet design combines a maximum magnetic field of over 1 kiloGauss with a simple construction and wire winding. Using this magnet, we will be able to rotate sample magnetizations in situ to observe switching times and profiles. |
