Research On The Mechanism Of PIN Limiter High-power Microwave Repetitive Pulse Effect

The electromagnetic environment faced by modern frequency radar systems such as radar and communications is becoming more and more complex.In particular,high-power microwaves can directly act on the radio frequency front-end of frequency systems,which poses a serious threat to the reliability of electronic devices.The PIN limiter is an important protection module in the front-end microwave receiving channel of the RF.Therefore,the research on the damage mechanism of the PIN limiter under the,action of high-power microwave has important significance for the development of the high-power microwave protection technology and high-power microwave effect technology of the electronic equipment.In this paper,theoretical and experimental studies on the damage mechanism of PIN limiter under repeated high power microwave pulse are carried out,and the cumulative effect of high power microwave damage under low repeat frequency rate is deeply analyzed.For the case where there is no heat accumulation,the phenomenon of gradual degradation of the performance of the device under repeated pulses is analyzed.Three stages of the growth process of micro-crack damage are proposed and experiments are designed to verify;for cases where there is significant heat accumulation,The combined pulse was designed based on the different stages of the peak leakage and the top leakage of the thermal effect of the high-power microwave pulse and the effect of the repeated pulse on the rectangular long pulse of the single system was verified.These are descriptions of the PIN limiter’s damage in a more realistic and complex electromagnetic environment.The main research work carried out is as follows:1.The physical mechanism of the damage effect of a typical radar RF front-end device is analyzed in depth.The theory of the intrinsic thermal effect of the PIN limiter is introduced.The application scope and limitations of the PIN limiter are discussed,and the damage effect on the microwave pulse repetition effect is proposed.The significance of conducting research,.2.For the case of low frequency,the thermal effect is not obviously accumulated,but the phenomenon of accumulated damage can occur.It is proposed that the device will still degrade to failure due to the existence of the micro-damage accumulation effect.The typical micro-damage forms of micro-cracking are studied.It is concluded that the growth process of micro-cracks on the anode surface of PIN diodes under high power microwave pulse is divided into three stages:defect accumulation,accelerated growth and damage expansion.Combining the microscopic physical properties of microcracks with the macroscopic electrical properties of the device,a high-power microwave repetitive pulse effect experiment was designed and conducted to verify the process of microdamage accumulation.3.For the case of transient high frequency,there is a significant heat accumulation.The multiphysics simulation and analysis of the multiphysics combined physics mechanism process are performed.The influence of pulse interval on the multi-system pulse effect is studied.High Power Microwave Multiple System Combined Pulse Effect Experiments.The simulation results and the experimental results show that the combination of pulse with proper pulse interval can have a serious impact on the PIN limiter,in which the pulse interval most likely to cause damage is close to the recovery time of the PIN diode.The dissertation analyzes two different angles from the study of the micro-damage growth process under the condition that the heat accumulation is not obvious and the efficiency of the input energy-induced damage under the condition of obvious heat accumulation,and gives a relatively reasonable physical explanation at the effect mechanism level.Some instructive effects rule.It provides a new idea for high-power microwave pulse protection design and has important reference significance.