Research And Implementation Of Wideband High Resolution Frequency Synthesizer

With the general application of CCD image sensor in various fields,the demand of domestic CCD for test and evaluation is increasingly urgent.However,due to the variety of CCD types,the increasing number of device pins,the increasing array size,the increasing number of image data output channels,and the different driving timing.There is an urgent need for a general test system which can reduce the design cycle of CCD image sensor test circuit and improve the consistency and comparability of parameter test.Aiming at the above problems,this thesis propose "a parametric CCD driving timing design method" and "a new CCD vertical driving circuit design method" and other innovative technologies,and cooperates with the newly developed powerful software control and image acquisition and processing system,through a reasonable system level electrical function division and structure design.It solves three problems:Hardware generalization,embedded software generalization and PC software generalization.At the same time,considering the performance factors such as EMC design,thermal design and redundancy design,a general test electrical system which can meet the parameters evaluation of various commonly used CCD image sensors is designed.And it has been successfully applied to the photoelectric parameter test evaluation of many projects,such as large wafer test(middle test),primary test after packaging(primary test),detailed parameter test(final test).In this thesis,the system architecture,design ideas and schemes,functions and performance indexes,circuit design and application objects are introduced from the aspects of design planning,hardware design,embedded software design,PC software design and application.In the process of technical research and system development,continuous improvement and optimization of design,in order to achieve the universal function at the same time,to ensure that the test performance of CCD device is not lower than the customized test circuit.Through the application and verification of several projects,the final test parameters of the system have reached the predetermined design index,and the overall performance is better than some special test circuits.At the same time of meeting the test requirements,it also actively develops and expands the application.After designing the transfer circuit,the system is applied to the high and lowtemperature test system and through frequency reduction,it is applied to the large wafer test.At the same time,in the aspect of demonstration imaging,the demonstration imaging of some devices is realized by cooperating with the manual large target focusing platform and lens.The system not only meets the test requirements of various types of CCD devices,but also has the test ability of 8 channels at high and low speed.At the same time,the noise index is reduced from 0.3mV of some special test circuits to0.15 mv.Compared with foreign expensive test system,this design has a large market competitiveness.In the process of testing and production of CCD image sensor applied in the industry,it will greatly save the investment of existing circuit designers and the cost of production and debugging of corresponding hardware circuit,save the time of test circuit research and development,shorten the research and development cycle,and improve the reliability,consistency and comparability of test parameters.The hidden value is immeasurable at present.