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Digital Logic Chip Detection System Based On ESD Protection Circuit

Posted on:2020-12-02Degree:MasterType:Thesis
Country:ChinaCandidate:W F DongFull Text:PDF
GTID:2428330623957549Subject:Electronic and communication engineering
Abstract/Summary:PDF Full Text Request
Digital electronic technology is a compulsory course for electronics related majors in colleges and universities.It mainly includes two parts of combination logic circuit and temporal logic circuit and their application.Digital electronic technology is also a very practical course,which requiring students to do experiments to deepen the understanding of the working principle of digital logic chips.Digital circuit experiments are inseparable from digital logic chips.Many colleges and universities purchase a batch of digital logic chips every year.The chip reuse rate is very low,which causes serious waste of digital logic chips.Digital circuit experiments use many different types of digital logic chips.Digital logic chips are often damaged due to improper storage methods,imperfect experimental platforms,and nonstandard manipulation of students.Due to more types of faults and the complicated testing process,it is difficult for laboratory managers to elimination faulty chips in time.Therefore,this paper applies ESD protection principle and fault dictionary method to design a digital logic chip automatic detection system.The system can detect whether the digital logic chip has short circuit,open circuit,logic function error and can determine the specific fault location.The test results are displayed to the user through the LCD screen or the host computer.After actual experiment and data analysis,it can be concluded that the detection system can detect digital logic chip failure better,the detection time of a single chip is about 3 seconds,the detection accuracy is as high as 99.4% and the running power consumption is as low as 0.44 W.The proposed system is very suitable for the application of digital electronic technology course in colleges and universities.and also can be used for final test by chip manufacturing companies.
Keywords/Search Tags:digital logic chip, ESD protection, automated detection, fault dictionary
PDF Full Text Request
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