Fault Diagnosis And Fault Simulation Of Digital Circuit Technology

A deep revolution is rising in electronic world. Therevolution is signed by Large Scale Integrated circuits andmicroprocessor. In recent years, Very Large Scale Integratedcircuits have been developing, which is changing traditional testingtheory, methods and technology. In area of modern testing technology,a new zone has being developed accordingly, which is called DigitalArea Testing. Fault simulation technology is at all times holdinga important position on testing areas, especially on Digital TestingAreas, so far as it has being spring up.The fault of electronic circuit during application is inevitably.To electronic circuit board in fault, in practice, we always try ourbest to find where its fault is, and more supply a reference formaintaining later. Aiming at the fault of electronic circuit duringapplication, several kinds of testing are deeply researched in thisthesis. Main contents of the thesis are producing algorithm oftesting vectors and methods of using fault simulation to judgingcovering rate of testing vectors in processes of inspecting faults,as well validating testable design of electronic circuit systems.Producing algorithm of testing vectors contains:Pseudo-exhaustive method, D algorithm, Main access sensitizingmethod, Fault dictionary method.