Design Of Comprehensive Test System For Photoelectric Device Characteristics

With the continuous development of optoelectronic information technology,optoelectronic devices are becoming more and more widely used in unmanned driving,biochemical detection,information transmission and other fields.The function and performance of the optoelectronic device directly determine the performance of the optoelectronic system and the ultimate user experience.In order to make up for the shortage of traditional photoelectric device characteristic parameter measuring instrument,this thesis optimizes and redesigns the photoelectric device comprehensive measuring system.The system is mainly used to characterize and test the photoelectric performance of semiconductor materials and devices.The test of semiconductor optoelectronic devices in the research and development stage has important guiding value for the further optimization of semiconductor optoelectronic characteristics and the development of new optoelectronic devices.This thesis sorts out the current testing needs of semiconductor optoelectronic devices,demonstrates the system plan,puts forward the overall design plan of the semiconductor optoelectronic device comprehensive test system,and designs and optimizes the system functional circuit,mechanical structure and application software,so that the system can meet the daily needs of semiconductor optoelectronic device characteristic testing.The functional circuit and mechanical structure mainly complete the mechanical structure design of the work cabinet,environmental control and sensing module design,data acquisition module design,signal conditioning module design,function switch module design.We designed the application software using Lab VIEW on the Windows operating system,including system initialization and main interface design module programming,parameter control and sensor module programming,data acquisition and characteristic test module programming.The main functions of the system include: 1)Users can configure the type of light source in the host computer application software to provide the light source with time-varying driving signals.2)Under the action of different types of light sources and excitation signals,the changes of electrical parameters of semiconductor photoelectric devices are obtained,mainly including photoelectric conversion efficiency,variable temperature and photoelectric performance parameters.3)The system can configure the parameters in the test process,at the same time can filter the test data,remove noise interference,and store the test results in real time to meet different test needs.Finally,we completed the overall debugging and testing of the system.The system can complete the testing of the characteristics of different semiconductor optoelectronic devices,realize the precise control of each module of the functional circuit,the accurate collection of measurement data,and the analysis and storage of the test results,and achieve the expected design goals.