Analysis Of Microchannel Plate Surface And Research On Its Defects Mechanism

The performance of Microchannel Plate(MCP)has important influence on the resolution,gain,field quality and dark counting of image intensifier.Surface defect is one of the main factors that affect the performance of MCP.The paper analyzes the process of MCP surface and its defects,reveals the mechanism of defect formation,and proposes a method to reduce the defect,which is of great significance to improve the performance and yield of MCP.Firstly,the process of MCP was analyzed,and the defects were classified into surface defects and process defects according to the morphology and the defects of MCP.Secondly,the formation mechanism of two kinds of defects was studied.Scanning electron microscopy(SEM)was used to characterize the surface and defect morphology of the MCP,and EDS was used to analyze the composition and content of the defect.It was found that the surface contaminant defects mainly originated from the higher activity of the MCP surface and the products of the corrosion cleaning reaction.In this paper,the origin of the process defect is revealed by the analysis of material properties and process parameters.The scribe is originated from the polishing process.The breaking point is originated from the low-frequency ultrasonic cleaning.The multifilament separation is caused by the low deformation temperature,Powder cutting caused by the boundaries of multi-wire holes,embedded and cause polishing powder pollution.The method of reducing the surface defects was proposed by reducing the surface contaminants by the cleaning method,reducing the scratches by step pressure polishing,selecting the high-frequency ultrasonic cleaning to reduce the break point,and adopting the measures of eliminating static electricity and improving the polishing process.Reducing the generation of inclusions.By selecting the solid edge material with the deformation temperature of 658?,the melting temperature was increased by 20°C,and the defects of multifilament separation were reduced.The results show that the surface defect of MCP is mainly due to its surface activity and unsuitable process parameters.The use of improved process and solid edge material,can be clean,smooth surface,while reducing the field of view defects,significantly improve the quality of the MCP,the product yield increased 5%,bringing a higher economic efficiency,...