Design And Verification Of E_fuse Read/write Control Module

Electrically programmable fuses(E_fuse)are widely used in system-on-chip(So C)design,in addition to traditional functions such as chip identity authentication(Chip ID)and memory repair,they are gradually applied to security applications in So C,with new features such as storage security keys.Driven by functions such as microprocessor code storage and secure application of on-chip encryption keys,the use of E-fuse has dramatically increased.As So C design integration and complexity increase,more E_fuse is also needed on the chip to manage the corresponding functions.The project originated from the project development needs of the internship company,and mainly carried out the E_fuse function design and verification work applied to the baseband chip.The results obtained are as follows:1.The paper uses the high-density metal fuse technology fabricated by Intel's 14 nm tri-gate high-k metal gate CMOS process,based on the study and analysis of the basic structure and principle of the E_fuse,the E_fuse array was divided into functional repository areas,which lays a technical foundation for the design of the subsequent E_fuse read/write control module.2.Based on the division of the functional repository areas,the Global System for Embedded Redundancy(GSER)is introduced,and designed a Tessent-compatible E-fuse read/write control module,the Global E-fuse Dispatcher(GED),which enables read and write control and function management of E_fuse.Compared with the traditional E_fuse module,it also has the function of internally writing memory repair information,which is also the innovation of this paper.3.After completing the GED module design,the Tessent solution is further used to complete the built-in self-repair of the fault memory in the So C.The reset state machine and the E_fuse state machine are designed to provide initial configuration information for the system,and provide the possibility of software programming E_fuse.Two configurations of the Fuse register are implemented.During the process of chip production and test,the E_fuse value can be changed through software configuration,and the source of the E_fuse value read by the system can be changed through the corresponding register configuration.Through the above design and research,the E_fuse function design applied to the So C is completed.4.For the designed GED module and E_fuse function design,divided the verification type and formulated the verification plan.The dynamic simulation technology is used to verify the function of the GED module,and then the assertion-based formal verification is used to verify the reset state machine.Finally,analyzed waveforms and data results,debugged errors,collected and improved coverage until the coverage reaches 100%,and completed verification of the E_fuse function.The application of the verified GED module in the baseband chip shows that the GED module designed in this paper can effectively control the function of E_fuse.At the same time,the GED module can also be used as an IP in next-generation baseband chips,saving corresponding development costs.This paper designed a GED module compatible with Tessent.It has strong practicability and can provide important technical reference for E_fuse related design and research.